Built-in self-test

#	Item
21	BIST-BASED GROUP TESTING FOR DIAGNOSIS OF EMBEDDED FPGA CORES Alireza Sarvi Carthik A. Sharma Add to Reading List Source URL: carthik.net Language: English - Date: 2008-06-23 18:14:37 Digital electronics Fabless semiconductor companies Reconfigurable computing Field-programmable gate array Xilinx Semiconductor intellectual property core Application-specific integrated circuit Built-in self-test Embedded system Electronic engineering Electronics Integrated circuits
22	BIST-BASED GROUP TESTING FOR DIAGNOSIS OF EMBEDDED FPGA CORES Alireza Sarvi _Al.Sarvi@xilinx.com_ Xilinx, Inc. 2100 Logic Dr. Add to Reading List Source URL: carthik.net Language: English - Date: 2008-06-23 18:04:15 Digital electronics Fabless semiconductor companies Reconfigurable computing Field-programmable gate array Xilinx Semiconductor intellectual property core Application-specific integrated circuit Built-in self-test Embedded system Electronic engineering Electronics Integrated circuits
23	PDF Document Add to Reading List Source URL: focus.ti.com Language: English Electronics Joint Test Action Group Design for testing Serial Vector Format Texas Instruments Scan chain Built-in self-test Boundary scan Electronics manufacturing Manufacturing Electronic engineering